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Heimes, D., Scheunert, J., Beyer, A., Belz, J., Firoozabadi, S., & Volz, K. (2021). Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks. Microscopy and Microanalysis, 27(S1), 450-452.
Heimes, Damien, et al. "Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks." Microscopy and Microanalysis 27.S1 (2021): 450-452.
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D Heimes, J Scheunert, A Beyer, J Belz… - Microscopy and …, 2021 - cambridge.org

Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks.

Research training stem

Belz, Beyer

GSID: l4RJI5qPV8oJ

Excerpt

… valuable information from 4D-STEM datasets, are convolutional … which are able to evaluate 4D-STEM data of III/V compounds … CBED training datasets are generated via STEM multislice …

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