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Park C, Jang K, Lee S, et al. A highly sensitive, direct and label-free technique for Hg(2+) detection using Kelvin probe force microscopy. Nanotechnology. 2015;26(30):305501doi: 10.1088/0957-4484/26/30/305501.
Park, C., Jang, K., Lee, S., You, J., Lee, S., Ha, H., Yun, K., Kim, J., Lee, H., Park, J., & Na, S. (2015). A highly sensitive, direct and label-free technique for Hg(2+) detection using Kelvin probe force microscopy. Nanotechnology, 26(30), 305501. https://doi.org/10.1088/0957-4484/26/30/305501
Park, Chanho, et al. "A highly sensitive, direct and label-free technique for Hg(2+) detection using Kelvin probe force microscopy." Nanotechnology vol. 26,30 (2015): 305501. doi: https://doi.org/10.1088/0957-4484/26/30/305501
Park C, Jang K, Lee S, You J, Lee S, Ha H, Yun K, Kim J, Lee H, Park J, Na S. A highly sensitive, direct and label-free technique for Hg(2+) detection using Kelvin probe force microscopy. Nanotechnology. 2015 Jul 31;26(30):305501. doi: 10.1088/0957-4484/26/30/305501. Epub 2015 Jul 08. PMID: 26152847.
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