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Fischione PE, Williams REA, Genç A, et al. A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation. Microsc Microanal. 2017;23(4):782-793doi: 10.1017/S1431927617000514.
Fischione, P. E., Williams, R. E. A., Genç, A., Fraser, H. L., Dunin-Borkowski, R. E., Luysberg, M., Bonifacio, C. S., & Kovács, A. (2017). A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 23(4), 782-793. https://doi.org/10.1017/S1431927617000514
Fischione, Paul E, et al. "A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23,4 (2017): 782-793. doi: https://doi.org/10.1017/S1431927617000514
Fischione PE, Williams REA, Genç A, Fraser HL, Dunin-Borkowski RE, Luysberg M, Bonifacio CS, Kovács A. A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation. Microsc Microanal. 2017 Aug;23(4):782-793. doi: 10.1017/S1431927617000514. Epub 2017 Jun 19. PMID: 28625222.
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