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Showing 1 to 8 of 8 entries
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NanoCell electronic memories.

Journal of the American Chemical Society

Tour JM, Cheng L, Nackashi DP, Yao Y, Flatt AK, St Angelo SK, Mallouk TE, Franzon PD.
PMID: 14570505
J Am Chem Soc. 2003 Oct 29;125(43):13279-83. doi: 10.1021/ja036369g.

NanoCells are disordered arrays of metallic islands that are interlinked with molecules between micrometer-sized metallic input/output leads. In the past, simulations had been conducted showing that the NanoCells may function as both memory and logic devices that are programmable...

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Tour JM, Cheng L, Nackashi DP, et al. NanoCell electronic memories. J Am Chem Soc. 2003;125(43):13279-83doi: 10.1021/ja036369g.
Tour, J. M., Cheng, L., Nackashi, D. P., Yao, Y., Flatt, A. K., St Angelo, S. K., Mallouk, T. E., & Franzon, P. D. (2003). NanoCell electronic memories. Journal of the American Chemical Society, 125(43), 13279-83. https://doi.org/10.1021/ja036369g
Tour, James M, et al. "NanoCell electronic memories." Journal of the American Chemical Society vol. 125,43 (2003): 13279-83. doi: https://doi.org/10.1021/ja036369g
Tour JM, Cheng L, Nackashi DP, Yao Y, Flatt AK, St Angelo SK, Mallouk TE, Franzon PD. NanoCell electronic memories. J Am Chem Soc. 2003 Oct 29;125(43):13279-83. doi: 10.1021/ja036369g. PMID: 14570505.
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Quality of life information and trust in physicians among families of children with life-limiting conditions.

Patient related outcome measures

Huang IC, Kenzik KM, Sanjeev TY, Shearer PD, Revicki DA, Nackashi JA, Shenkman EA.
PMID: 21760753
Patient Relat Outcome Meas. 2010 Oct;2010(1):141-148. doi: 10.2147/prom.s12564.

PURPOSE: To examine information that parents of children with life-limiting conditions want to discuss with children's physicians to assist decision-making, and whether the desire for this information is associated with parents' trust in physicians. STUDY DESIGN: A cross-sectional study...

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Huang IC, Kenzik KM, Sanjeev TY, et al. Quality of life information and trust in physicians among families of children with life-limiting conditions. Patient Relat Outcome Meas. 2010;2010(1):141-148doi: 10.2147/prom.s12564.
Huang, I. C., Kenzik, K. M., Sanjeev, T. Y., Shearer, P. D., Revicki, D. A., Nackashi, J. A., & Shenkman, E. A. (2010). Quality of life information and trust in physicians among families of children with life-limiting conditions. Patient related outcome measures, 2010(1), 141-148. https://doi.org/10.2147/prom.s12564
Huang, I-Chan, et al. "Quality of life information and trust in physicians among families of children with life-limiting conditions." Patient related outcome measures vol. 2010,1 (2010): 141-148. doi: https://doi.org/10.2147/prom.s12564
Huang IC, Kenzik KM, Sanjeev TY, Shearer PD, Revicki DA, Nackashi JA, Shenkman EA. Quality of life information and trust in physicians among families of children with life-limiting conditions. Patient Relat Outcome Meas. 2010 Oct;2010(1):141-148. doi: 10.2147/prom.s12564. PMID: 21760753; PMCID: PMC3134229.
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Quantitative electrochemical measurements using in situ ec-S/TEM devices.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Unocic RR, Sacci RL, Brown GM, Veith GM, Dudney NJ, More KL, Walden FS, Gardiner DS, Damiano J, Nackashi DP.
PMID: 24618013
Microsc Microanal. 2014 Apr;20(2):452-61. doi: 10.1017/S1431927614000166. Epub 2014 Mar 11.

Insight into dynamic electrochemical processes can be obtained with in situ electrochemical-scanning/transmission electron microscopy (ec-S/TEM), a technique that utilizes microfluidic electrochemical cells to characterize electrochemical processes with S/TEM imaging, diffraction, or spectroscopy. The microfluidic electrochemical cell is composed of...

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Unocic RR, Sacci RL, Brown GM, et al. Quantitative electrochemical measurements using in situ ec-S/TEM devices. Microsc Microanal. 2014;20(2):452-61doi: 10.1017/S1431927614000166.
Unocic, R. R., Sacci, R. L., Brown, G. M., Veith, G. M., Dudney, N. J., More, K. L., Walden, F. S., Gardiner, D. S., Damiano, J., & Nackashi, D. P. (2014). Quantitative electrochemical measurements using in situ ec-S/TEM devices. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 20(2), 452-61. https://doi.org/10.1017/S1431927614000166
Unocic, Raymond R, et al. "Quantitative electrochemical measurements using in situ ec-S/TEM devices." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 20,2 (2014): 452-61. doi: https://doi.org/10.1017/S1431927614000166
Unocic RR, Sacci RL, Brown GM, Veith GM, Dudney NJ, More KL, Walden FS, Gardiner DS, Damiano J, Nackashi DP. Quantitative electrochemical measurements using in situ ec-S/TEM devices. Microsc Microanal. 2014 Apr;20(2):452-61. doi: 10.1017/S1431927614000166. Epub 2014 Mar 11. PMID: 24618013.
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Scaling constraints in nanoelectronic random-access memories.

Nanotechnology

Amsinck CJ, Di Spigna NH, Nackashi DP, Franzon PD.
PMID: 20818005
Nanotechnology. 2005 Oct;16(10):2251-60. doi: 10.1088/0957-4484/16/10/047. Epub 2005 Aug 26.

Nanoelectronic molecular and magnetic tunnel junction (MTJ) MRAM crossbar memory systems have the potential to present significant area advantages (4 to 6F(2)) compared to CMOS-based systems. The scalability of these conductivity-switched RAM arrays is examined by establishing criteria for...

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Amsinck CJ, Di Spigna NH, Nackashi DP, et al. Scaling constraints in nanoelectronic random-access memories. Nanotechnology. 2005;16(10):2251-60doi: 10.1088/0957-4484/16/10/047.
Amsinck, C. J., Di Spigna, N. H., Nackashi, D. P., & Franzon, P. D. (2005). Scaling constraints in nanoelectronic random-access memories. Nanotechnology, 16(10), 2251-60. https://doi.org/10.1088/0957-4484/16/10/047
Amsinck, Christian J, et al. "Scaling constraints in nanoelectronic random-access memories." Nanotechnology vol. 16,10 (2005): 2251-60. doi: https://doi.org/10.1088/0957-4484/16/10/047
Amsinck CJ, Di Spigna NH, Nackashi DP, Franzon PD. Scaling constraints in nanoelectronic random-access memories. Nanotechnology. 2005 Oct;16(10):2251-60. doi: 10.1088/0957-4484/16/10/047. Epub 2005 Aug 26. PMID: 20818005.
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The continuum of care program.

Clinical pediatrics

Nackashi JA, Shenkman EA, Reiss JG, Siderits PJ.
PMID: 8261723
Clin Pediatr (Phila). 1993 Oct;32(10):601-4. doi: 10.1177/000992289303201007.

No abstract available.

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Nackashi JA, Shenkman EA, Reiss JG, et al. The continuum of care program. Clin Pediatr (Phila). 1993;32(10):601-4doi: 10.1177/000992289303201007.
Nackashi, J. A., Shenkman, E. A., Reiss, J. G., & Siderits, P. J. (1993). The continuum of care program. Clinical pediatrics, 32(10), 601-4. https://doi.org/10.1177/000992289303201007
Nackashi, J A, et al. "The continuum of care program." Clinical pediatrics vol. 32,10 (1993): 601-4. doi: https://doi.org/10.1177/000992289303201007
Nackashi JA, Shenkman EA, Reiss JG, Siderits PJ. The continuum of care program. Clin Pediatr (Phila). 1993 Oct;32(10):601-4. doi: 10.1177/000992289303201007. PMID: 8261723.
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Controlled modulation of conductance in silicon devices by molecular monolayers.

Journal of the American Chemical Society

He T, He J, Lu M, Chen B, Pang H, Reus WF, Nolte WM, Nackashi DP, Franzon PD, Tour JM.
PMID: 17090037
J Am Chem Soc. 2006 Nov 15;128(45):14537-41. doi: 10.1021/ja063571l.

We have controllably modulated the drain current (I(D)) and threshold voltage (V(T)) in pseudo metal-oxide-semiconductor field-effect transistors (MOSFETs) by grafting a monolayer of molecules atop oxide-free H-passivated silicon surfaces. An electronically controlled series of molecules, from strong pi-electron donors...

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He T, He J, Lu M, et al. Controlled modulation of conductance in silicon devices by molecular monolayers. J Am Chem Soc. 2006;128(45):14537-41doi: 10.1021/ja063571l.
He, T., He, J., Lu, M., Chen, B., Pang, H., Reus, W. F., Nolte, W. M., Nackashi, D. P., Franzon, P. D., & Tour, J. M. (2006). Controlled modulation of conductance in silicon devices by molecular monolayers. Journal of the American Chemical Society, 128(45), 14537-41. https://doi.org/10.1021/ja063571l
He, Tao, et al. "Controlled modulation of conductance in silicon devices by molecular monolayers." Journal of the American Chemical Society vol. 128,45 (2006): 14537-41. doi: https://doi.org/10.1021/ja063571l
He T, He J, Lu M, Chen B, Pang H, Reus WF, Nolte WM, Nackashi DP, Franzon PD, Tour JM. Controlled modulation of conductance in silicon devices by molecular monolayers. J Am Chem Soc. 2006 Nov 15;128(45):14537-41. doi: 10.1021/ja063571l. PMID: 17090037.
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Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Allard LF, Overbury SH, Bigelow WC, Katz MB, Nackashi DP, Damiano J.
PMID: 22835379
Microsc Microanal. 2012 Aug;18(4):656-66. doi: 10.1017/S1431927612001249. Epub 2012 Jul 27.

In prior research, specimen holders that employ a novel MEMS-based heating technology (Aduro™) provided by Protochips Inc. (Raleigh, NC, USA) have been shown to permit sub-Ångström imaging at elevated temperatures up to 1,000°C during in situ heating experiments in...

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Allard LF, Overbury SH, Bigelow WC, et al. Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microsc Microanal. 2012;18(4):656-66doi: 10.1017/S1431927612001249.
Allard, L. F., Overbury, S. H., Bigelow, W. C., Katz, M. B., Nackashi, D. P., & Damiano, J. (2012). Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 18(4), 656-66. https://doi.org/10.1017/S1431927612001249
Allard, Lawrence F, et al. "Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18,4 (2012): 656-66. doi: https://doi.org/10.1017/S1431927612001249
Allard LF, Overbury SH, Bigelow WC, Katz MB, Nackashi DP, Damiano J. Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microsc Microanal. 2012 Aug;18(4):656-66. doi: 10.1017/S1431927612001249. Epub 2012 Jul 27. PMID: 22835379.
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An improved holey carbon film for cryo-electron microscopy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Quispe J, Damiano J, Mick SE, Nackashi DP, Fellmann D, Ajero TG, Carragher B, Potter CS.
PMID: 17900388
Microsc Microanal. 2007 Oct;13(5):365-71. doi: 10.1017/S1431927607070791.

Two issues that often impact the cryo-electron microscopy (cryoEM) specimen preparation process are agglomeration of particles near hole edges in holey carbon films and variations in vitreous ice thickness. In many cases, the source of these issues was identified...

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Quispe J, Damiano J, Mick SE, et al. An improved holey carbon film for cryo-electron microscopy. Microsc Microanal. 2007;13(5):365-71doi: 10.1017/S1431927607070791.
Quispe, J., Damiano, J., Mick, S. E., Nackashi, D. P., Fellmann, D., Ajero, T. G., Carragher, B., & Potter, C. S. (2007). An improved holey carbon film for cryo-electron microscopy. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 13(5), 365-71. https://doi.org/10.1017/S1431927607070791
Quispe, Joel, et al. "An improved holey carbon film for cryo-electron microscopy." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13,5 (2007): 365-71. doi: https://doi.org/10.1017/S1431927607070791
Quispe J, Damiano J, Mick SE, Nackashi DP, Fellmann D, Ajero TG, Carragher B, Potter CS. An improved holey carbon film for cryo-electron microscopy. Microsc Microanal. 2007 Oct;13(5):365-71. doi: 10.1017/S1431927607070791. PMID: 17900388.
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Showing 1 to 8 of 8 entries