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Dittrich K, Mothes W, Yudelevich IG, et al. Investigations of trace analysis of A(III)B(V) semiconductor microsamples by atomic spectroscopy-VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation. Talanta. 1985;32(3):195-201doi: 10.1016/0039-9140(85)80059-x.
Dittrich, K., Mothes, W., Yudelevich, I. G., & Papina, T. S. (1985). Investigations of trace analysis of A(III)B(V) semiconductor microsamples by atomic spectroscopy-VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation. Talanta, 32(3), 195-201. https://doi.org/10.1016/0039-9140(85)80059-x
Dittrich, K, et al. "Investigations of trace analysis of A(III)B(V) semiconductor microsamples by atomic spectroscopy-VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation." Talanta vol. 32,3 (1985): 195-201. doi: https://doi.org/10.1016/0039-9140(85)80059-x
Dittrich K, Mothes W, Yudelevich IG, Papina TS. Investigations of trace analysis of A(III)B(V) semiconductor microsamples by atomic spectroscopy-VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation. Talanta. 1985 Mar;32(3):195-201. doi: 10.1016/0039-9140(85)80059-x. PMID: 18963824.
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