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Zhang X, Cen X, Ravichandran R, et al. Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems. Microsc Microanal. 2016;22(3):565-75doi: 10.1017/S1431927616000751.
Zhang, X., Cen, X., Ravichandran, R., Hughes, L. A., & van Benthem, K. (2016). Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22(3), 565-75. https://doi.org/10.1017/S1431927616000751
Zhang, Xinming, et al. "Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22,3 (2016): 565-75. doi: https://doi.org/10.1017/S1431927616000751
Zhang X, Cen X, Ravichandran R, Hughes LA, van Benthem K. Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems. Microsc Microanal. 2016 Jun;22(3):565-75. doi: 10.1017/S1431927616000751. Epub 2016 May 04. PMID: 27142307.
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