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Grévin B, Schwartz PO, Biniek L, et al. High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor-acceptor dyads. Beilstein J Nanotechnol. 2016;7:799-808doi: 10.3762/bjnano.7.71.
Grévin, B., Schwartz, P. O., Biniek, L., Brinkmann, M., Leclerc, N., Zaborova, E., & Méry, S. (2016). High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor-acceptor dyads. Beilstein journal of nanotechnology, 7799-808. https://doi.org/10.3762/bjnano.7.71
Grévin, Benjamin, et al. "High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor-acceptor dyads." Beilstein journal of nanotechnology vol. 7 (2016): 799-808. doi: https://doi.org/10.3762/bjnano.7.71
Grévin B, Schwartz PO, Biniek L, Brinkmann M, Leclerc N, Zaborova E, Méry S. High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor-acceptor dyads. Beilstein J Nanotechnol. 2016 Jun 03;7:799-808. doi: 10.3762/bjnano.7.71. eCollection 2016. PMID: 27335768; PMCID: PMC4902083.
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