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Korsunska N, Khomenkova L, Kolomys O, et al. Si-rich Al2O3 films grown by RF magnetron sputtering: structural and photoluminescence properties versus annealing treatment. Nanoscale Res Lett. 2013;8(1):273doi: 10.1186/1556-276X-8-273.
Korsunska, N., Khomenkova, L., Kolomys, O., Strelchuk, V., Kuchuk, A., Kladko, V., Stara, T., Oberemok, O., Romanyuk, B., Marie, P., Jedrzejewski, J., & Balberg, I. (2013). Si-rich Al2O3 films grown by RF magnetron sputtering: structural and photoluminescence properties versus annealing treatment. Nanoscale research letters, 8(1), 273. https://doi.org/10.1186/1556-276X-8-273
Korsunska, Nadiia, et al. "Si-rich Al2O3 films grown by RF magnetron sputtering: structural and photoluminescence properties versus annealing treatment." Nanoscale research letters vol. 8,1 (2013): 273. doi: https://doi.org/10.1186/1556-276X-8-273
Korsunska N, Khomenkova L, Kolomys O, Strelchuk V, Kuchuk A, Kladko V, Stara T, Oberemok O, Romanyuk B, Marie P, Jedrzejewski J, Balberg I. Si-rich Al2O3 films grown by RF magnetron sputtering: structural and photoluminescence properties versus annealing treatment. Nanoscale Res Lett. 2013 Jun 07;8(1):273. doi: 10.1186/1556-276X-8-273. PMID: 23758885; PMCID: PMC3680024.
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